Summary
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Epitaxial growth of MnF2
films on Si(111) & Si(001) as thick as 350 nm has been demonstrated
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Epitaxial growth of MnF2-CaF2
superlattices on Si(111) with CaF2 buffer
layer
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Atomically smooth growth surface and single
crystallinity of SL
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Flat surface morphology during MnF2-CdF2
superlattice growth
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Well-pronounced superstructural reflections
in X-ray diffraction as a result of additional periodicity in the SLs
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Blue shift of Mn2+
broad band emission
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X-ray diffractometry showed that the films
have alpha-PbO2
type orthorhombic structure with the following epitaxial relations: (111)MnF2
II (111)Si
& [-211] MnF2
II [-211]Si;
for Si(001): [100]MnF2
|| [001]Si
Contact person: Nikolai S.Sokolov
Tel.: +7 (812) 247-6411 Fax: +7 (812) 247-8640;
e-mail: nsokolov@fl.ioffe.rssi.ru;
Postal address: Postal address:
26 Polytekhnicheskaya, St. Petersburg 194021, Russian Federation N.S.Sokolov
Web master: MarinaMoisseeva
e-mail: marina@fl.ioffe.rssi.ru;
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