MBE-growth and studies 
   of MnF2 films on Si(111) and Si(001).
Motivation and methods
Main properties of MnF2 and CdF2 crystals
MBE growth of MnF2-CdF2 epitaxial layers
RHEED monitoring of SL growth
Double crystal X-ray diffractometry 
Photoluminescence of annealed MnF2/Si(111) structures
High Temperature Growth MnF2/Si(111)
AFM & RHEED images of annealed MnF2/CaF2/Si(111)
AFM & RHEED images of MnF2 layers on CaF2/Si(001)
Superlattice surface morphology
Summary
AFM & RHEED images of annealed MnF2/CaF2/Si(111)
120-350 nm thick single-crystal films with flat surface


 
  • a-recrystallization annealing at 550°C(RA); b-100 nm MnF2 film grown at 400°C;c-RA of 25nm x 4 
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    Contact person: Nikolai S.Sokolov Tel.: +7 (812) 247-6411 Fax: +7 (812) 247-8640;
    e-mail: nsokolov@fl.ioffe.rssi.ru;
    Postal address: Postal address: 26 Polytekhnicheskaya, St. Petersburg 194021, Russian Federation N.S.Sokolov

    Web master: MarinaMoisseeva
    e-mail: marina@fl.ioffe.rssi.ru;
     

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