MBE-growth and studies 
   of MnF2 films on Si(111) and Si(001).
Motivation and methods
Main properties of MnF2 and CdF2 crystals
MBE growth of MnF2-CdF2 epitaxial layers
RHEED monitoring of SL growth
Double crystal X-ray diffractometry 
Photoluminescence of annealed MnF2/Si(111) structures
High Temperature Growth MnF2/Si(111)
AFM & RHEED images of annealed MnF2/CaF2/Si(111)
AFM & RHEED images of MnF2 layers on CaF2/Si(001)
Superlattice surface morphology
Summary

Double crystal X-ray diffractometry

[MnF2 3ML/CdF2 10ML]*21/CaF2 12ML/Si(111)
 
 

 



 


Contact person: Nikolai S.Sokolov Tel.: +7 (812) 247-6411 Fax: +7 (812) 247-8640;
e-mail: nsokolov@fl.ioffe.rssi.ru;
Postal address: Postal address: 26 Polytekhnicheskaya, St. Petersburg 194021, Russian Federation N.S. Sokolov

Web master: MarinaMoisseeva
e-mail: marina@fl.ioffe.rssi.ru;
 

Last revision: